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Study on fast fault diagnosis of capacitor with tolerance based on BIST
  • 所属机构名称：哈尔滨工业大学
  • 会议名称：2009 4th IEEE Conference on Industrial Electronics and Applications, ICIEA 2009
  • 成果类型：会议
  • 会场：Xi';an, China
  • 相关项目：发射率及温度自适应分离算法
作者： Chunling, Yang|Chao, Sun|Min, Zhu|
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发射率及温度自适应分离算法
期刊论文 13 会议论文 8
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