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An on-chip test clock control scheme for multi-clock at-speed testing
  • 所属机构名称：中国科学院计算技术研究所
  • 会议名称：16th Asian Test Symposium, ATS 2007
  • 成果类型：会议
  • 会场：Beijing, China
  • 相关项目：面向串扰的时延测试
作者： Fan, Xiaoxin|Wang, Laung-Terng|Hu, Yu|
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面向串扰的时延测试
期刊论文 19 会议论文 13 专利 3
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