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A novel ESD self-protecting symmetric nLDMOS for 60V SOI BCD process
所属机构名称:北京大学
会议名称:Electron Devices and Solid-State Circuits (EDSSC), 2013 IEEE International Conference of
时间:2013
成果类型:会议
相关项目:纳米尺度SOI器件ESD工艺方法、模型模拟和器件结构研究
作者:
Yuan Wang|Guangyi Lu|Jian Cao|Qi Liu|Ganggang Zhang|Xing Zhang|
同会议论文项目
纳米尺度SOI器件ESD工艺方法、模型模拟和器件结构研究
期刊论文 4
会议论文 9
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