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Design of Electromagnetic Tomography System based on Integrated Impedance Analyzer
  • 所属机构名称：北京交通大学
  • 会议名称：26th IEEE International Instrumentation and Measurement Technology Conference (I2MTC2009)
  • 成果类型：会议
  • 会场：Singapore, SINGAPORE
  • 相关项目：基于电磁层析成像的重伤钢轨损伤探测研究
作者： Liu, Ze|Yin, Wuliang|Sun, Xiufang|
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基于电磁层析成像的重伤钢轨损伤探测研究
期刊论文 8 会议论文 9 专利 3
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