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Generating compact robust and non-robust tests for complete coverage of path delay faults based on s
所属机构名称:清华大学
成果类型:会议
相关项目:容错计算
同会议论文项目
容错计算
期刊论文 19
会议论文 17
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Compressing test data for deterministic BIST using a reconfigurable scan architecture
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Scan testing for complete coverage of path delay faults with reduced test data volume, test applicat
Fast and effective fault simulation for path delay faults based on selected testable paths