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Cycle time reduction in assembly and test manufacturing factories: A KPI driven methodology
  • 所属机构名称：清华大学
  • 会议名称：2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008
  • 成果类型：会议
  • 会场：Singapore, Singapore
  • 相关项目：具有多环特征的芯片生产系统建模和性能分析
作者： Xiao, Jing|Feng, Wei|Li, Na|Hou, Forest|Zheng, Li|
同会议论文项目
具有多环特征的芯片生产系统建模和性能分析
期刊论文 9 会议论文 7
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