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Surface Trapping Parameters of Solid Dielectrics: Novel Measurement Method and Insulation Condition
  • 所属机构名称：西安交通大学
  • 会议名称：Proceedings of 2012 IEEE International Conference on Condition Monitoring and Diagnosis
  • 时间：2012.9.9
  • 成果类型：会议
  • 相关项目：真空脉冲绝缘用可加工陶瓷的制备与应用研究
作者： Guan-Jun Zhang|Wen-Wei Shen|Hai-Bao Mu|Jun-Bo Deng|
同会议论文项目
真空脉冲绝缘用可加工陶瓷的制备与应用研究
期刊论文 47 会议论文 23 专利 3
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