位置：成果数据库 > 会议 > 会议详情页
Reliability evaluation of an implantable deep brain stimulator
  • 所属机构名称：清华大学
  • 会议名称：9th International Conference on Reliability, Maintainability and Safety (ICRMS 2011)
  • 时间：2011.6.6
  • 成果类型：会议
  • 相关项目：植入式脑深部刺激器的闭环控制方法研究
作者： Wang WM|Ma BZ|Hao HW|Li LM|
同会议论文项目
植入式脑深部刺激器的闭环控制方法研究
期刊论文 6 会议论文 6
同项目会议论文
Reliability evaluation and improvement of deep brain stimulator based on accelerated flexing test
Development of a Uni-acupoint Transcutaneous Electric Nerve Stimulation Device for Electroacupunctur
Fatigue Test of Helical Nervous Electrodes and Weak Point Analysis of Helical Nervous Electrodes Des
Epileptic Seizure Detection With the Local Field Potential of Anterior Thalamic of Rats Aiming at Re
STUDY ON DBS DEVICE FOR SMALL ANIMALS