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FlexMemory: exploiting and managing abundant off-chip optical bandwidth
所属机构名称:中国科学院计算技术研究所
会议名称:IEEE/ACM Design, Automation, and Test in Europe (DATE)
时间:2011.3.3
成果类型:会议
相关项目:三维芯片中硅直通孔和晶片电路的测试技术研究
作者:
Ying Wang|Lei Zhang|Yinhe Han*|Huawei Li|Xiaowei Li|
同会议论文项目
三维芯片中硅直通孔和晶片电路的测试技术研究
期刊论文 13
会议论文 13
专利 3
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