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Surface smoothness detection algorithm based on two-dimensional wavelet and computer vision
  • 所属机构名称：北京信息科技大学
  • 会议名称：7th International Symposium on Instrumentation and Control Technology: Sensors and Instruments, Comp
  • 成果类型：会议
  • 会场：Beijing, China
  • 相关项目：现场大尺寸数字摄影测量的精度理论研究
作者： Lu, Nai-Guang|Yang, Jian|Dong, Mingli|
同会议论文项目
现场大尺寸数字摄影测量的精度理论研究
期刊论文 41 会议论文 13 专利 4
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