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Determination of Semiconductor Properties Through Hall-Effect Measurement with Contactless Microwave
  • 所属机构名称：中国科学技术大学
  • 会议名称：Proceedings of the International Conference on Microwave Photonics, Kyoto, Japan, 1996
  • 作者或编辑：3448
  • 语言：英文
  • 成果类型：会议
  • 相关项目：表面波导引结构辐射特性的研究
作者： Sheng Xinqing and Xu Shanjia|
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表面波导引结构辐射特性的研究
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