位置：成果数据库 > 会议 > 会议详情页
Correlation Analysis of Alarm Data and Alarm Limit Design for Industrial Processes
  • 所属机构名称：清华大学
  • 会议名称：American Control Conference
  • 成果类型：会议
  • 相关项目：基于SDG的大规模复杂系统半定量故障诊断研究
作者： Yang Fan|Shah Sirish L|Xiao Deyun|
同会议论文项目
基于SDG的大规模复杂系统半定量故障诊断研究
期刊论文 16 会议论文 7
同项目会议论文
Detection of direct causality based on process data
An extended AUDI algorithm for simultaneous identification of forward and backward paths in closed-l
Multi-fault diagnosis for industrial processes based on hybrid dynamic Bayesian network
Improved correlation analysis and visualization of industrial alarm data
SDG (signed directed graph) based process description and fault propagation analysis for a tailings
Signed directed graph modeling of industrial processes and their validation by data-based methods