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Determining band offset and interface charge density of hydrogenated nanocrystalline silicon/crystal
  • 所属机构名称：上海交通大学
  • 会议名称：6th International Conference on Thin Film Physics and Applications
  • 成果类型：会议
  • 会场：Shanghai, PEOPLES R CHINA
  • 相关项目：有序硅量子点结构中的输运特性及量子调控研究
作者： He, Y. L.|Shen, W. Z.|Jiang, Z. Z.|Chen, J.|Lu, J. J.|
同会议论文项目
有序硅量子点结构中的输运特性及量子调控研究
期刊论文 39 会议论文 6
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