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Bit Cell Arrangement and Reduction of Switching Field Sensitivity to Manufacturing Tolerances of Bit
所属机构名称:华中科技大学
会议名称:The 2011 International Magnetics Conference (INTERMAG 2011)
成果类型:会议
会场:台湾
相关项目:超低飞高条件下硬盘磁头的运行姿态建模与测量方法
作者:
Shu Xu|
同会议论文项目
超低飞高条件下硬盘磁头的运行姿态建模与测量方法
期刊论文 14
会议论文 11
专利 11
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