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Improved Algorithm of Charge Density in Surface Charge Measurement Based on Pockels Effects
  • 所属机构名称：西安交通大学
  • 会议名称：th Asian Conference on Electrical Discharge
  • 成果类型：会议
  • 会场：Xi’an
  • 相关项目：真空绝缘用可加工陶瓷沿面闪络现象的机理与抑制
作者： Hai-Bao Mu|Yasuhiro Tanaka|Guan-Jun Zhang|
同会议论文项目
真空绝缘用可加工陶瓷沿面闪络现象的机理与抑制
期刊论文 25 会议论文 16
同项目会议论文
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表面腐蚀对半导体真空闪络特性的影响
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