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High-resolution, Dynamic Three-dimensional Profilometry Based on a Combination of Stereovision and C
  • 所属机构名称：深圳大学
  • 会议名称：Conference on Optical Metrology and Inspection for Industrial Applications
  • 成果类型：会议
  • 会场：Beijing, PEOPLES R CHINA
  • 相关项目：多传感机制的微电子封装三维精密视觉检测
作者： Li, Dong|Tian, Jindong|
同会议论文项目
多传感机制的微电子封装三维精密视觉检测
期刊论文 2 会议论文 6 专利 4
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