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Test Pattern Selection for Small-Delay Defects Considering Hazards
  • 所属机构名称：中国科学院计算技术研究所
  • 会议名称：15th IEEE Pacific Rim International Symposium on Dependable Computing
  • 成果类型：会议
  • 会场：Shanghai, China
  • 相关项目：面向串扰的时延测试
作者： Huaguo Liang|Xiaowei Li|Yinghua Min|Huawei Li|Jie Wang|
同会议论文项目
面向串扰的时延测试
期刊论文 19 会议论文 13 专利 3
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