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Selection Method of Optimum Wavelet Bases for Image Signature
  • 所属机构名称：西安理工大学
  • 会议名称：ICSP2010,the 10th IEEE International Conference on Signal Processing
  • 时间：2010.10.10
  • 成果类型：会议
  • 相关项目：斑点诊断与容错计算技术研究及应用
作者： Wang Xiaofeng|Dou Chunni|Tian Lihua|
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斑点诊断与容错计算技术研究及应用
期刊论文 53 会议论文 11 专利 1
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