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Applications of RFID in a SCOR-model Driven Enterprise Production System
  • 所属机构名称：清华大学
  • 会议名称：2010 IEEE 17th International Conference on Industrial Engineering and Engineering Management
  • 成果类型：会议
  • 会场：中国厦门
  • 相关项目：具有多环特征的芯片生产系统建模和性能分析
作者： 陈旋|危凯权|郑力|向晴|
同会议论文项目
具有多环特征的芯片生产系统建模和性能分析
期刊论文 9 会议论文 7
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