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Quantitative detection of defect using ultrasound infrared lock-in thermography
  • 所属机构名称：哈尔滨工业大学
  • 会议名称：5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test
  • 成果类型：会议
  • 会场：Dalian, China
  • 相关项目：基于红外探测的飞机蒙皮及机场跑道损伤检测技术研究
作者： Liu, Junyan|Wang, Yang|Liu, Hui|
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基于红外探测的飞机蒙皮及机场跑道损伤检测技术研究
期刊论文 8 会议论文 9 专利 1
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