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Geometric Calibration of Cone-beam CT with a Flat-panel Detector.
  • 所属机构名称：清华大学
  • 会议名称：IEEE Nss/Mic meeting
  • 成果类型：会议
  • 相关项目：即时CT系统成像方法关键技术研究
作者： Dufan Wu|Liang Li|Li Zhang|
同会议论文项目
即时CT系统成像方法关键技术研究
期刊论文 18 会议论文 15 获奖 4
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