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An simple approach to evaluate TID response in high voltage MOSFET for 65nm flash technology
  • 所属机构名称：中国科学院微电子研究所
  • 会议名称：14th IEEE International Conference on Solid-State and Integrated Circuit Technology（ICSICT2014）
  • 时间：2014.10.28
  • 成果类型：会议
  • 相关项目：面向三维集成的纳米尺度电荷陷阱存储器机理与可靠性研究
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面向三维集成的纳米尺度电荷陷阱存储器机理与可靠性研究
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