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Pseudo-functional testing for small delay defects considering power supply noise effects
  • 所属机构名称：中国科学院深圳先进技术研究院
  • 会议名称：2011 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2011
  • 成果类型：会议
  • 会场：San Jose, CA
  • 相关项目：基于片上网络的系统芯片测试架构设计与优化研究
作者： Liu X.|Yuan F.|Xu Q.|
同会议论文项目
基于片上网络的系统芯片测试架构设计与优化研究
期刊论文 6 会议论文 8
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