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Reduced-Reference Image Quality Assessment withLocal Binary Structural Pattern
  • 所属机构名称：北京空间机电研究所
  • 会议名称：IEEE International Symposium on Circuits & Systems
  • 时间：2014
  • 成果类型：会议
  • 相关项目：基于光谱压缩的线阵推帚式超光谱成像机理研究
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Reduced-ReferenceImage Quality Assessment with Local Binary Structural Pattern
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