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Simple Power Analysis on Elliptic Curve Cryptosystems and Countermeasures: Practical Work
  • 所属机构名称：中国科学院深圳先进技术研究院
  • 会议名称：2nd International Symposium on Electronic Commerce and Security
  • 成果类型：会议
  • 相关项目：在设计阶段验证密码芯片安全程度的方法
作者： Wu, Keke|Li, Huiyun|Chen, Tingding|Yu, Fengqi|
同会议论文项目
在设计阶段验证密码芯片安全程度的方法
期刊论文 6 会议论文 12 专利 5
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