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Scaling of reliability of gold interconnect lines subjected to alternating current
  • ISSN号：0003-6951
  • 期刊名称：Applied Physics Letters
  • 时间：0
  • 页码：-
  • 相关项目：无约束单晶金属薄膜的疲劳行为及其尺寸效应的研究
作者： Wang, M.|Zhang, B.|Zhang, G. P.|Liu, C. S.|
同期刊论文项目
无约束单晶金属薄膜的疲劳行为及其尺寸效应的研究
期刊论文 13
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