中文摘要：

我们已报道过YBa2Cu3O7-δ（YBCO）的过热现象并且对其过热的机制进行了研究．在本文的工作中，主要研究了YBCO薄膜的微结构对于其过热行为的影响．通过高温金相显微镜对具有不同微结构的YB（的薄膜的不同的熔化行为进行了实时观测，并且用原子力显微镜（AFM）和X射线衍射仪（XRD）对这些具有不同品质的薄膜进行表征．结果表明，YBCO薄膜的微结构对于其过热度以及整个薄膜熔化的过程有很大的影响，高品质的薄膜具有低界面缺陷比率，由此导致了其在熔化过程中较高的过热度．本文同时在实时观测，AFM和XRD所得到实验结果的基础上，通过半共格界面能的理论很好的解释了YBCO薄膜在不同的微结构情况下体现出来熔化和过热行为的差异．

英文摘要：

Different melting behaviors were observed in-situ from YBCO thin films with varied microstructures by using high temperature optical microscopy （HTOM）. To investigate the influence of microstructure, these films with different microstructure were also characterized by atomic force microscopy （AFM） and X-ray diffraction （XRD）. It was found that the crystalline structure features of the seed film have strong relationships with the degree of superheating and the melting behavior. The high quality film with low fraction of interface defects is believed to be responsible for the high superheating.