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Evaluation on residual stress in Bi3.15(Eu0.7Nd0.15)Ti3O12 polycrystalline ferroelectric thin film b
  • 期刊名称：Appl. Phys. Lett.
  • 时间：0
  • 页码：-
  • 相关项目：低维铁电材料的制备、力学表征及其微器件应用
作者： Y. Wei|H. B. Cheng|X. Y. Wang|X. J. Zheng|
同期刊论文项目
低维铁电材料的制备、力学表征及其微器件应用
期刊论文 59
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