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多铁性BiFeO3/SrTiO3多层膜的透射电镜研究
  • ISSN号：1000-6281
  • 期刊名称：《电子显微学报》
  • 时间：0
  • 分类：TG115.215.3[金属学及工艺—物理冶金;金属学及工艺—金属学] TB383[一般工业技术—材料科学与工程]
  • 作者机构：[1]中国科学院金属研究所沈阳材料科学国家（联合）实验室,辽宁沈阳110016, [2]浙江理工大学光电材料与器件中心,浙江杭州310018
  • 相关基金：国家自然科学基金面上资助项目（No.50871115及No.50672088）; 科技部973资助项目（No.2009CB623705）
作者： 唐兆俊[1], 王君伟[2], 朱银莲[1], 唐为华[2], 马秀良[1]
关键词： 多铁性, 多层膜, 界面, 透射电子显微术, multiferroics, multilayers, interface, transmission electron microscopy
中文摘要：

本文利用透射电子显微镜（TEM）研究了由磁控溅射法生长的多铁性BiFeO3/SrTiO3多层膜的微观结构。衍衬分析及高分辨电子显微（HRTEM）像显示出界面清晰的各个单层。BiFeO3外延生长在SrTiO3（001）衬底上,生长方向沿基体c轴。随着薄膜厚度的增加,即多层膜周期的加长,层与层之间界面不再平直。原子序数Z衬度成像,EDS线扫以及各种元素的能量过滤综合分析确定了多层膜的成分变化特征。

英文摘要：

Microstructures of BiFeO3 /SrTiO3 Multiferroic multilayers prepared by magnetron sputtering were studied by transmission electron microscopy（TEM）.Electron diffraction and contrast analysis reveal a very clear and well separated layer sequence.The BiFeO3 /SrTiO3 multilayer is epitaxially grown on the substrate.The interface between the thin film and the substrate is sharp and distinct.High-angle angular dark-field imaging,elemental mapping and compositional analysis revealed that the compositions vary with the layer periodicity as expected.Due to the local composition inhomogeneity resulted from the sputtering process,it is found that interfaces become rough when increasing the thickness of the films.

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期刊信息
  • 《电子显微学报》
  • 中国科技核心期刊
  • 主管单位:中国科学技术协会
  • 主办单位:中国物理学会
  • 主编：张 泽
  • 地址：北京市海淀区中关村北二条13号5号楼301
  • 邮编：100190
  • 邮箱：dzxwxb@blem.ac.cn
  • 电话：010-82671519 62565522/3301
  • 国际标准刊号：ISSN：1000-6281
  • 国内统一刊号：ISSN：11-2295/TN
  • 邮发代号:
  • 获奖情况:
  • 曾获《中国科技论文统计源期刊（中国科技核心期刊）》,《中国科学引文数据库(核心库)》来源期刊,中国自然科学核心期刊（无线电电子学、电信技术类...
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  • 被引量:6569