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An Interconnect-Line-Size Optimization Model Considering Scattering Effect
  • ISSN号：0741-3106
  • 期刊名称：IEEE Electron Device Letters
  • 时间：0
  • 页码：641-643
  • 相关项目：非标准逻辑数字电路的衬底噪声建模及验证技术研究
作者： Zhu, Zhangming|Wan, Dajing|Yang, Yintang|
同期刊论文项目
非标准逻辑数字电路的衬底噪声建模及验证技术研究
期刊论文 53
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