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中文摘要：
提出一种基于加权相容图的可测性寄存器分配模型，给出一个基于可测寄存器分配准则的相容图边的权值公式，并运用改进的加权团划分算法对加权相容图进行处理，从而实现了在寄存器分配过程中同时考虑4个可测性准则，达到提高设计可测性的目的．实验结果表明了算法在可测性方面的有效性．
英文摘要：
A novel model, weighted compatibility graph （WBCG）is proposed for solving register allocation for testability problem. A weighted formula of compatibility graph based on register allocation for testability is presented. An improved weightedbased clique partition algorithm is used to deal with this weighted compatibility graph. Thereby, four rules for testability are considered simultaneous in the course of register allocation and achieved the objective of high design for testability. Finally ,experimental results show that the algorithm can improve the testability of final designs.
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