中文摘要：

背散射电子图像分析技术可用来定性和定量地研究硬化水泥浆体的微观结构，但用于背散射电子图像分析的水泥浆体需进行抛光处理，如处理不当会显著影响图像分析的准确性和精确性。介绍了水泥浆体样品抛光后的品质要求，分析了不同样品表面缺陷对图像分析结果的影响；针对水泥浆体研究了树脂镶嵌方法对镶嵌深度的影响。结果表明：提高树脂填充度是制备合格抛光样品的关键技术，树脂填充度低的抛光面一般同时存在其他缺陷，如粒子脱落、平光度低；在树脂镶嵌过程中，运用适当的操作方法可提高样品的树脂镶嵌深度。

英文摘要：

Backscattered electron imaging and analysis （BSE-IA） is invaluable in cement research due to its ability of qualitative and quantitative analysis. For BSE-IA, polished specimens of cement pastes should be prepared first. The accuracy of BSE-IA is mainly determined by the quality of flat-polished specimens. The requirements for quanlified flat-polished specimens and its effect on the BSE-IA were described. In addition, some factors influencing the epoxy intrusion depth aiming at slag cement paste were investigated. It was showed that epoxy intrusion played a key role in preparing qualified specimens since without epoxy filling other defects existed meanwhile such as particles fall-off, low planness. The use of appropriate measurements could improve the epoxy intrusion.