为了降低现有内部模板攻击的数据复杂度并提高攻击成功率,提出了一种内部模板攻击改进算法.对内部模板攻击算法进行了两点改进:一是在模板匹配分析阶段,提出了一种基于等级相关性的模板匹配策略,利用功耗曲线电压值的相对排名,提高了单个密钥片段恢复的局部成功率;二是在密钥恢复阶段,提出了一种基于校验方程的密钥恢复方法,利用冗余信息来修正猜测多个密钥片段的概率分布,提高了多密钥片段恢复的全局成功率.以8位微控制器上的LED(轻型加密设备)密码功耗旁路分析为例,开展了攻击验证实验.结果表明:改进后的算法提高了匹配的区分度,降低了攻击所需功耗曲线数量,仅需要50条功耗曲线即可使攻击的全局成功概率接近100%.
An improved algorithm was proposed to reduce the data complexity and improve the success rate of the internal template attack .Two improvements were introduced in the proposed algorithm . Firstly ,in template matching phase ,a template matching strategy based on calculating the rank corre‐lation coefficient was proposed ,which could exploit the relative ranks of the voltages in the power trace and improve the partial success rate of single key piece recovery .Secondly ,in the key recovery phase ,a key recovery strategy based on verification equations was proposed ,which could utilize the redundant information to correct the probability distribution of multiple key pieces and improve the global success rate of multiple key pieces recovery .The feasibility of the proposed algorithm was veri‐fied by conducting power analysis attack against LED(light encryption device) implemented on an 8 bit microcontroller .Experiments results demonstrate that the improved algorithm can enlarge the dis‐crimination of different templates and reduce the number of the required power trace required in the at‐tack .Under the experiment setup ,only 50 power traces are required to launch the attack with the success ratio close to 100% .