作者机构:[1]Key Laboratory of Instrumentation Science and Dynamic Measurement of the Ministry Education North University of China, Taiyuan 030051, China, [2]Institute of Microelectronics, Peking University, Beijing 100871, China
相关基金:Project supported in part by the National Natural Science Foundation of China (Grant No 50775209), the Fork Ying Tung Education Foundation (Grant No 101052) and Program for Excellent Talents by Ministry of Education of China.