中文摘要：

聚酰亚胺（PI）／无机纳米杂化材料具有良好的电绝缘性、优异的机械性能以及高耐热等特性，广泛地应用于电气电子领域。本文利用同步辐射小角X射线散射（SAXS）技术对聚酰亚胺纳米杂化薄膜（Al2O3/PI）进行微观结构分析，结合透射电子显微镜（TEM）测试的结果，研究了杂化薄膜中无机纳米颗粒的特性。研究结果表明，无机纳米颗粒尺寸约为4-7nm，纳米颗粒与基体之间具有明锐的界面，薄膜体系分形维数为2．48。

英文摘要：

Inorganic nanohybrid polyirnide （PI） has wide applications in electric and electronics for its outstanding insulating, mechanical and heat-resistance properties. Al2O3/PI nanohybrid films of 100CR （Dupont）, with excellent corona-resistance, were characterized by synchrotron radiation small angle X-ray scattering （SAXS） and transmission electric microscopy （TEM）. The results show that the inorganic particles are 4-7 nm in size. The interface between nanoparficles and matrix is sharp. Fractal dimension of the film is 2.48.