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中文摘要：
通过蒸发诱导自组装技术制备了具有不同有序结构的介孔SiO2薄膜,并采用同步辐射X射线反射率以及慢正电子束流技术对其进行表征.实验结果表明,随着旋涂速率的增加,介孔结构由三维立方向二维六角结构转变,同时平均孔隙率随转速增加而减小.利用各向同性无机孔收缩模型和Fourier变换红外光谱,探讨了薄膜结构和正电子湮没参数的内在联系.
英文摘要：
Mesoporous silica thin films with different pore shapes were prepared by evaporation induced self-assembly method. The synchrotron radiation x-ray reflectivity and slow positron annihilation techniques were used to characterize the pore structures. The results indicated that with increase of the spin-coating speed,the pore structure transformed from 3-D cubic to 2-D hexagonal,the average porosity also decreased. The correlation of the film structures and positron annihilation parameters was songht for with FT-IR spectroscopy and isotropic inorganic pore contraction model.
同期刊论文项目
同项目期刊论文
Thickness Impacts of Vacancy Defects in Epitaxial La0.7Sr0.3MnO3 Thin Films Using Slow Positron Beam
Identification of the pressure-induced phase transition of ZnSe with the positron annihilation metho
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