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非晶壳层Si_xN/Si_yC包覆硅量子点的微结构表征(英文)
  • 期刊名称：纳米科技
  • 时间：0
  • 页码：70-75
  • 相关项目：应变硅/硅锗微细特征单元结构失稳及应变弛豫研究
作者： 畅庚榕|马飞|马大衍|徐可为|
同期刊论文项目
应变硅/硅锗微细特征单元结构失稳及应变弛豫研究
期刊论文 18
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