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中文摘要：
在双步测试向量转换解决方案的基础上，构建了一个通用的测试向量转换模型．在细化双步解决方案的过程中，提出了一个改进的转换流程；将标准测试接口语言（STIL）作为描述语言，设计了一种具有per-pin-ATE资源的数据格式；开发了面向3种国产测试仪的测试向量转换系统——SpeedyE2A（S）．实验结果表明，在相同的转换条件下，当测试向量较大时。SpeedyE2A（S）系统的转换时间远远少于Credence的TDS系统．经SpeedyE2A（S）系统转换的8051和海尔“爱国者”芯片的测试向量，已经成功地在北京自动测试技术研究所的测试系统上运行。
英文摘要：
This paper presents a general test vector translation model based on the two-step translation method. The model includes two major parts, the first part is the improved translation flow, and the second part is the data format supporting the per-pin-ATE resource, which is described in STIL. Based on this translation model, we developed the test vector translation system SpeedyE2A（S） for three self-developed ATEs. Experimental results show that SpeedyE2A （S） can significantly reduce the translation time compared with TDS when translating large test vectors. The translated vectors by SpeedyE2A （S） are successfully applied to test 8051 microcontroller and Haier HDTV integrated circuits on the ATE of Beijing Automated Test Technology Institute.
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The Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Micropro
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