本研究以AgNO3和TEOS为原料,乙二醇独甲醚为溶剂,利用溶胶.凝胶法配制前躯体溶液,在玻璃基片上用匀胶法制备了Ag含量为50%(质量分数)的Ag纳米颗粒分散SiO2薄膜。利用X射线衍射、紫外可见分光光度计对Ag/SiO2复合薄膜的微观结构,光学吸收谱进行了表征和测试。研究了复合薄膜的制备工艺和不同热处理温度对薄膜光吸收特性的影响。DSC曲线表明热处理温度为200℃时薄膜中有Ag颗粒形成,300℃时薄膜中有机物完全分解。吸收光谱研究表明:Ag/SiO2薄膜在410-430nm波长范围内有明显的表面等离子共振吸收峰,随着热处理温度的升高SPR吸收峰的强度增强,峰宽变窄,峰位发生蓝移。
The Ag/SiO2 composite thin films with 50wt% Ag were prepared on a glass substrate by a sol-gel method at different annealing temperatures for 0.5 hour. The phase structure was characterized by XRD and optical absorption spectra were measured in the range of 200- 1000 nm by a ultraviolet spectrometer. The preparation process of composite thin films and effects of different heat treat temperatures on optical absorption properties were investigated. The DSC result shows that Ag particles were formed at 200℃ and the remnant organic compound was completely decomposed at 300℃. The mean diameter of the Ag particles in the films is about 20 nm after annealing at 500℃. The optical absorption peaks due to the surface plasmon resonance appear in the wavelength range of 420- 438 nm. With the annealing temperatures increasing the intensity of the absorption peaks increase and the blue shift of SPR peaks occurs.