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Near-field properties of diffraction through a circular subwavelength-size aperture
  • ISSN号:1674-1056
  • 期刊名称:《中国物理B:英文版》
  • 时间:0
  • 分类:O436.1[机械工程—光学工程;理学—光学;理学—物理] TN823.13[电子电信—信息与通信工程]
  • 作者机构:[1]School of Materials Science and Engineering, Jiangsu University, Zhenjiang 212013, China, [2]Department of Physics, Jiangsu University, Zhenjiang 212013, China
  • 相关基金:Project supported by the National Natural Science Foundation of China (Grant No. 50975128), the National Key Basic Research Program of China (Grant No. 2011CB013004), the Natural Science Foundation of Jiangsu Province, China (Grant No. BK2011462), the National Science Foundation for Postdoctoral Scientists of China (Grant No. 20100481093), and Jiangsu Provincial Planned Projects for Postdoctoral Research Funds, China (Grant No. 0902028C).
中文摘要:

Analytical nonparaxial vectorial electric field expressions for both Gaussian beams and plane waves diffracted through a circular aperture are derived by using the vector plane angular spectrum method for the first time,which is suitable for the subwavelength aperture and the near-field region.The transverse properties of intensity distributions and their evolutions with the propagating distance,and the power transmission functions for diffracted fields containing the whole field,the evanescent field and the propagating field are investigated in detail,which is helpful for understanding the relationship between evanescent and propagating components in the near-field region and can be applied to apertured near-field scanning optical microscopy.

英文摘要:

Analytical nonparaxial vectorial electric field expressions for both Gaussian beams and plane waves diffracted through a circular aperture are derived by using the vector plane angular spectrum method for the first time, which is suitable for the subwavelength aperture and the near-field region. The transverse properties of intensity distributions and their evolutions with the propagating distance, and the power transmission functions for diffracted fields containing the whole field, the evanescent field and the propagating field are investigated in detail, which is helpful for understanding the relationship between evanescent and propagating components in the near-field region and can be applied to apertured near-field scanning optical microscopy.

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期刊信息
  • 《中国物理B:英文版》
  • 中国科技核心期刊
  • 主管单位:中国科学院
  • 主办单位:中国物理学会和中国科学院物理研究所
  • 主编:欧阳钟灿
  • 地址:北京 中关村 中国科学院物理研究所内
  • 邮编:100080
  • 邮箱:
  • 电话:010-82649026 82649519
  • 国际标准刊号:ISSN:1674-1056
  • 国内统一刊号:ISSN:11-5639/O4
  • 邮发代号:
  • 获奖情况:
  • 国内外数据库收录:
  • 被引量:406