中文摘要：

采用多道脉冲幅度分析器测定216Po6．78MeV能谱峰对6．00MeV计数区的峰重叠因子μ为0．0897．将流气式固体220Rn源作为标准源测定220Rn测量仪测220Rn刻度系数为9．4004．提高了半导体探测法型220Rn测量仪刻度的准确性与测220Rn准确度．

英文摘要：

In this paper, the calibration of 220Rn measurement about semiconductor detection-based 220Rn measurement instrument have been accomplished. And the peak overlap factor and the calibration coefficient were determined by multi-channel pulse amplitude analyzer and 220Rn flow-through source respectively. The results of experiment showed that the probability of 6.78 MeV ct particle emitted by 216po slowing down to the 6.00 MeV α particle counts region can＇ t be ignored, and it can take 0.0897,9. 4004 as typical values of peak overlap factor/x and calibration coefficient of 220Rn measurement respectively. Obviously, this work will improve the calibration and 220 Rn measurement accuracy of semiconductor detection-based 220Rn measurement instrument.