采用溶胶凝胶法制备了Sm和Pr掺杂的CeO2和CeMoO15基固体电解质,通过X射线衍射(XRD)、拉曼光谱(Raman)、场发射扫描电镜(FE—SEM)等手段对氧化物结构进行了分析,用交流阻抗谱测试了其电性能,并比较了不同基体及其掺杂体系的结构与电性能.结果表明,Ce6MoO15基掺杂体系的导电性能高于CeO2基掺杂体系;元素Mo的加入使Ce6MoO15基材料的晶粒尺寸增大,晶界相成分减少,材料的晶界电导率增加,600℃以下材料导电性能明显提高;Pr的掺入减小了材料的晶粒尺寸,提高了材料的晶界电导率.
Sm and Pr doped CeO2 and Ce6MoO15 based materials were synthesized by sol-gel method. The structure of the powders were characterized by X-ray diffraction( XRD), Raman spectra, field emission scanning electron microscopy(FE-SEM) and the electrical conductivity of the samples was investigated by AC impedance spectroscopy. By comparing the structure and electrical properties of different systems, it could be concluded that the electrical property of Ce6MoO15 based system is better than that of CeO2 system. The added Mo element resulted in the increase of gain size and improved the grain boundary conductivity notably below 600 ℃, while the Pr dopant induced the smaller grain size and improved the grain boundary conductivity of the materials.