Implementation of FLIM and SIFT for improved intraoperative delineation of glioblastoma margin
- ISSN号：1671-7694
- 期刊名称：《中国光学快报：英文版》
- 时间：0
- 分类：TN912.3[电子电信—通信与信息系统;电子电信—信息与通信工程] TS76[轻工技术与工程—制浆造纸工程]
- 作者机构：[1]Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Cuangdong Province, College of Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China, [2]Department of Dermatology, The Sixth People's Hospital of Shenzhen, Shenzhen 518052, China, [3]Department of Pathology, The Sixth People's Hospital of Shenzhen, Shenzhen 518052, China, [4]Bioimaging Core, Faculty of Health Sciences, University of Macau, Taipa, Maeau SAR China
- 相关基金：This work was supported by the National Basic Research Program of China （No. 2015CB352005）, the National Natural Science Foundation of China （Nos. 61525503, 61378091, and 61620106016）, the Guangdong Natural Science Foundation Innovation Team （No. 2014A030312008）, the Hong Kong, Macao and Taiwan cooperation innovation platform ＆ major projects of international cooperation in Colleges and the Universities in Guangdong Province （No. 2015KGJHZ002）, JCYJ2016032814 4746940, and GJHZ20160226202139185）.and the Shenzhen Basic Research Project （Nos. JCYJ20150930104948169, JCYJ2016032814 4746940, and GJHZ20160226202139185）.
中文摘要：
Corresponding author： jlqu@szu.edu.com
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