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Thickness effects of Bi0.89Ti0.11FeO3 thin films deposited on PbZr0.2Ti0.79Nb0.01O3 buffer layers
  • ISSN号：0925-8388
  • 期刊名称：Journal of Alloys and Compounds
  • 时间：0
  • 页码：431-434
  • 相关项目：用于集成压电芯片的BiFeO3-基薄膜的漏电流和老化抑制
作者： X.M. Chen|G.D. Hu|J.C. Wang|L. Cheng|C.H. Yang|W.B. Wu|
同期刊论文项目
用于集成压电芯片的BiFeO3-基薄膜的漏电流和老化抑制
期刊论文 11 专利 1
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