目的:探讨光弹应力分析法在双层结构全瓷冠应力分析中的应用。方法:配制一定比例的环氧树脂模拟下颌第一磨牙双层结构全瓷冠饰瓷、核瓷与基牙,并依次组合,将瓷层和基牙粘接前后的平面模型和剖面模型置于光弹仪下加载观察应力分布情况。根据模型中等色线判读应力分布情况。结果:剖面模型较平面模型更符合临床全瓷修复体的真实形态;应力分布不均匀,饰瓷层应力较高,最大的应力值出现在加载点下方的饰瓷层下表面;粘接后的模型较粘接前应力分布和应力值均有差异。结论:光弹应力分析法适用于双层结构全瓷冠应力分布的研究,可用于观测全瓷冠的应力分布趋势及其变化。
Objective: To evaluate the significance of photoelastic method in the stress analysis of the bilayer all-ceramic dental crown.Methods: The bound and unbound models were made of a proportion of epoxy resin and combined with core layer,veneer layer and substrate.The models were loaded in photoelastic apparatus.The stress distribution was observed from the isochromatic fringe in the bound and unbound models.Results: The section model was much more like the all-ceramic restoration in practice.More stresses were concentrated in the veneer layer than in the core layer and substrate.The maximum stress value was on the low surface of veneer layer under the loading area.There was different stress distribution between bound and unbound models.Conclusion: Photoelastic stress analysis method can be used in the study of the stress distribution in ceramic dental crown with bilayer structure.