To extract features of fabric defects effectively and reduce dimension of feature space,a feature extraction method of fabric defects based on complex contourlet transform(CCT)and principal component analysis(PCA)is proposed.Firstly,training samples of fabric defect images are decomposed by CCT.Secondly,PCA is applied in the obtained low-frequency component and part of highfrequency components to get a lower dimensional feature space.Finally,components of testing samples obtained by CCT are projected onto the feature space where different types of fabric defects are distinguished by the minimum Euclidean distance method.A large number of experimental results show that,compared with PCA,the method combining wavelet low-frequency component with PCA(WLPCA),the method combining contourlet transform with PCA(CPCA),and the method combining wavelet low-frequency and highfrequency components with PCA(WPCA),the proposed method can extract features of common fabric defect types effectively.The recognition rate is greatly improved while the dimension is reduced.
To extract features of fabric defects effectively and reduce dimension of feature space,a feature extraction method of fabric defects based on complex contourlet transform (CCT) and principal component analysis (PCA) is proposed.Firstly,training samples of fabric defect images are decomposed by CCT.Secondly,PCA is applied in the obtained low-frequency component and part of highfrequency components to get a lower dimensional feature space.Finally,components of testing samples obtained by CCT are projected onto the feature space where different types of fabric defects are distinguished by the minimum Euclidean distance method.A large number of experimental results show that,compared with PCA,the method combining wavdet low-frequency component with PCA (WLPCA),the method combining contourlet transform with PCA (CPCA),and the method combining wavelet low-frequency and highfrequency components with PCA (WPCA),the proposed method can extract features of common fabric defect types effectively.The recognition rate is greatly improved while the dimension is reduced.