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Thin silicon layer SOI power device with linearly-distance fixed charge islands
  • ISSN号:1674-4926
  • 期刊名称:《半导体学报:英文版》
  • 时间:0
  • 分类:TN303[电子电信—物理电子学] P736.14[天文地球—海洋地质;天文地球—海洋科学]
  • 作者机构:[1]Guangxi Experiment Center of Information Science, Guilin University of Electronic Technology, Guilin 541004, China, [2]State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China, [3]College of Electronic Engineering, Guangxi Normal University, Guilin 541004, China
  • 相关基金:Project supported by the Guangxi Natural Science Foundation of China (No. 2013GXNSFAA019335), the Guangxi Department of Educa- tion Project (No.201202ZD041), the China Postdoctoral Science Foundation Project (Nos. 2012M521127, 2013T60566), and the National Natural Science Foundation of China (Nos. 61361011, 61274077, 61464003).
中文摘要:

A new high-voltage LDMOS with linearly-distanced fixed charge islands is proposed(LFI LDMOS).A lot of linearly-distanced fixed charge islands are introduced by implanting the Cs or I ion into the buried oxide layer and dynamic holes are attracted and accumulated,which is crucial to enhance the electric field of the buried oxide and the vertical breakdown voltage.The surface electric field is improved by increasing the distance between two adjacent fixed charge islands from source to drain,which lead to the higher concentration of the drift region and a lower on-resistance.The numerical results indicate that the breakdown voltage of 500 V with L_d = 45 μm is obtained in the proposed device in comparison to 209 V of conventional LDMOS,while maintaining low onresistance.

英文摘要:

A new high-voltage LDMOS with linearly-distanced fixed charge islands is proposed (LFI LDMOS). A lot of linearly-distanced fixed charge islands are introduced by implanting the Cs or I ion into the buried oxide layer and dynamic holes are attracted and accumulated, which is crucial to enhance the electric field of the buried oxide and the vertical breakdown voltage. The surface electric field is improved by increasing the distance between two adjacent fixed charge islands from source to drain, which lead to the higher concentration of the drift region and a lower on-resistance. The numerical results indicate that the breakdown voltage of 500 V with Ld = 45μm is obtained in the proposed device in comparison to 209 V of conventional LDMOS, while maintaining low on- resistance.

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期刊信息
  • 《半导体学报:英文版》
  • 中国科技核心期刊
  • 主管单位:中国科学院
  • 主办单位:中国电子学会 中国科学院半导体研究所
  • 主编:李树深
  • 地址:北京912信箱
  • 邮编:100083
  • 邮箱:cjs@semi.ac.cn
  • 电话:010-82304277
  • 国际标准刊号:ISSN:1674-4926
  • 国内统一刊号:ISSN:11-5781/TN
  • 邮发代号:2-184
  • 获奖情况:
  • 90年获中科院优秀期刊二等奖,92年获国家科委、中共中央宣传部和国家新闻出版署...,97年国家科委、中共中央中宣传部和国家新出版署三等奖,中国期刊方阵“双效”期刊
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  • 俄罗斯文摘杂志,美国化学文摘(网络版),荷兰文摘与引文数据库,美国工程索引,美国剑桥科学文摘,英国科学文摘数据库,日本日本科学技术振兴机构数据库,中国中国科技核心期刊,中国北大核心期刊(2004版),中国北大核心期刊(2008版),英国英国皇家化学学会文摘,中国北大核心期刊(2000版)
  • 被引量:7754