目前的很多仪器设备中需要分辨率优于ns量级的时间量化仪和延迟单元。研究了利用信号在传输时的延迟来进行时间量化的可行性及其特点。实验结果表明基于传输延迟的时间量化技术较国外报道的基于CMOS门延迟的时间量化技术有线性度好、温度稳定性好、结构简单、实现容易等特点。采用导线延迟技术实现了一个分辨率优于300ps,量化范围优于2ns的时间量化仪。它的特点是延迟线后级检测电路参数的差异对这种设计有影响,必须经过标定,经过标定之后对某些特殊点的时间量化精度可达12ps。同时指出了当提高分辨率时面临的问题以及基于ASIC技术的解决方法。
Time to digital converter (TDC) and time delay element with a resolution better than nanosecond are in great demand in many instruments and measurements at present. Transmission delay and its application in a Time to digital technology (TDT) are studied in this paper. The relationships between resolution, precision, quality and stability are pointed out in theory; and then experiments are carried out to test the analysis result. Experiment resuits show that the new TDT is better than traditional TDT based on COMS delay element in resolution, precision, stability and manufacturing. Furthermore, a TDC with a resolution better than 300 ps and a digital range better than 2 ns is designed using this technology. The TDC delay accuracy has relationship with the detection circuits used and as high as 12 ps delay accuracy can be achieved when a calibration is carried out.