中文摘要：

半导体测试是资金高度密集、涉及产品种类与设备种类繁多的半导体生产环节。半导体测试需要同时使用测试机、送料机台和使能器等资源。资源组合及其可加工的产品类型的对应关系错综复杂，大多数半导体测试调度问题是考虑多资源约束和作业换型时间的平行机调度问题。分别从问题和方法两个角度对半导体测试调度研究进行分析，归纳了附加资源充足的测试调度和附加资源受限的测试调度两大类问题，并对目前半导体测试调度的各类方法进行总结对比，分析了各类方法的特点。

英文摘要：

Semiconductor test is a capital intensive multi-product production process with complicated testing resources. To test a semiconductor product, a tester, a handler and an enabler are simultaneously in need. The relationship of product and qualified tester-handler-enabler combination is very complicated. Most semiconductor test problems are multiple resources constrained unrelated parallel machine scheduling problems with consideration of sequence-dependant setup times. A survey on semiconductor test scheduling respectively from the point of view of problem category and methodology were given. The semiconductor test scheduling problems were analyzed by two categories： without and with simultaneous resources constraint. The scheduling methods in literature were summarized and their characteristics were discussed by comparison.