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The Operation Cutoff Frequency of High Electron Mobility Transistor Measured by Terahertz Method
  • ISSN号：0003-6951
  • 期刊名称：Applied Physics Letters
  • 时间：2014
  • 页码：011105-
  • 相关项目：时域太赫兹波谱法研究高电场下砷化镓内高频段的负微分电导特性
作者： Y. M. Zhu|S. L. Zhuang|
同期刊论文项目
时域太赫兹波谱法研究高电场下砷化镓内高频段的负微分电导特性
期刊论文 62 会议论文 15
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